RESEARCH ON CHIPS’ DEFECT EXTRACTION BASED ON IMAGE-MATCHING

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International Journal on Smart Sensing and Intelligent Systems

Professor Subhas Chandra Mukhopadhyay

Exeley Inc. (New York)

Subject: Computational Science & Engineering, Engineering, Electrical & Electronic

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eISSN: 1178-5608

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VOLUME 7 , ISSUE 1 (March 2014) > List of articles

RESEARCH ON CHIPS’ DEFECT EXTRACTION BASED ON IMAGE-MATCHING

Daode Zhang

Citation Information : International Journal on Smart Sensing and Intelligent Systems. Volume 7, Issue 1, Pages 321-336, DOI: https://doi.org/10.21307/ijssis-2017-658

License : (CC BY-NC-ND 4.0)

Received Date : 20-July-2013 / Accepted: 12-February-2014 / Published Online: 27-December-2017

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