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International Journal on Smart Sensing and Intelligent Systems

Professor Subhas Chandra Mukhopadhyay

Exeley Inc. (New York)

Subject: Computational Science & Engineering, Engineering, Electrical & Electronic


eISSN: 1178-5608



VOLUME 8 , ISSUE 2 (June 2015) > List of articles


Xiang Hua * / Jinjin Zhang * / Bin Lei *

Keywords : photoelectric theodolite, data process, error model, random error, error estimate

Citation Information : International Journal on Smart Sensing and Intelligent Systems. Volume 8, Issue 2, Pages 1,180-1,202, DOI:

License : (CC BY-NC-ND 4.0)

Published Online: 20-November-2017



Measure error of photoelectric theodolite would influence result precision when tracking flight target. This paper researches error problem of testing. It analyses all the causes of error forming, divides them to several sorts: system error, random error and outlier error, then provides resolution method to each sort. Especially for random error, it builds an error model, analyses the properties of unbiased, equal variance and uncorrelated, conducts best error estimate, discuss the relationship between choosing and effect of kernel function and smooth parameter. While it researches measure theory of coplanar intersection and dis-coplanar intersection of photoelectric theodolite, derives a series of measure formulas, builds random error model respectively, and analyses the relationship of effect actors. By comparing simulation of model with experiment measurement, the result shows the error model and processing method is correct.

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