SEARCH WITHIN CONTENT
Citation Information : International Journal on Smart Sensing and Intelligent Systems. Volume 9, Issue 2, Pages 509-525, DOI: https://doi.org/10.21307/ijssis-2017-881
License : (CC BY-NC-ND 4.0)
Received Date : 03-February-2016 / Accepted: 31-March-2016 / Published Online: 01-June-2016
A circuit design with bespoke control software is described which has delivered precision in electrical impedance measurements of ~ 10ppm, after calibration. It is low-cost and applicable to jobs such as direct measurement using a sensor whose resistance changes with some physical quantity of interest; calibration at end of line in the production of such sensors; or calibration of equipment which may be out of warranty. It was developed using resistance temperature detectors (RTDs).
 “ITS-90: Temperature Reference.” [Online]. Available: http://www.its-90.com/onref.html. [Accessed: 16-Jun-2014].
 A. S. Morris, Measurement and Instrumentation Principles (3rd Edition). Butterworth-Heinemann, 2001, p. 29.
 A. S. Morris, Measurement and Instrumentation Principles (3rd Edition). Butterworth-Heinemann, 2001, p. 70.
 C. L. Dotson, Fundamentals of Dimensional Metrology. Cengage Learning, 2015, p. 225.
 Agilent Technologies, “Truevolt Series Digital Multimeters,” 2013. [Online]. Available: http://www.coretechnology.com.tw/comm/upfile/p_140314_03420.pdf, p. 10.
 B. Jeanneret and S. P. Benz, “Application of the Josephson effect in electrical metrology,” Eur. Phys. J. Spec. Top., vol. 172, no. 181–206, p. 7, 2009.
 P. P. L. Regtien, F. van der Heijden, M. J. Korsten, and W. Olthuis, Measurement Science for Engineers. Elsevier Ltd, 2004, p. 172.
 K. F. Anderson, “The Anderson Loop: NASA’s Successor to the Wheatstone Bridge.” [Online]. Available: http://www.vm-usa.com/papers/nswb.pdf. [Accessed: 10-Nov-2015].
 L. Callegaro, Electrical Impedance: Principles, Measurement, and Applications, vol. 6. Boca Raton, FL: CRC Press, 2012.
 G. Hill, “High Accuracy Temperature Measurements using RTD’s with Current Loop Conditioning.” [Online]. Available: http://www.vm-usa.com/nasa-tm-107416.pdf. [Accessed: 04-Jul-2014].
 Measurement Computing, “USB-2408 Series.” [Online]. Available: http://www.mccdaq.com/PDFs/specs/USB-2408-Series-data.pdf. [Accessed: 12-Nov-2015], p. 13.
 Measurement Computing, “USB-2408 Series User’s Guide,” 2014. [Online]. Available: http://www.mccdaq.com/pdfs/manuals/USB-2408-Series.pdf.
 Texas Instruments, “CSD16570Q5B 25-V N-Channel NexFETTM Power MOSFET,” 2014. [Online]. Available: http://www.ti.com/lit/ds/symlink/csd16570q5b.pdf. [Accessed: 02-Feb-2016].
 Linear Technology, “SAR ADC Input Types.” [Online]. Available: http://cds.linear.com/docs/en/product-selector-card/2PB_sarinputtypesfb.pdf. [Accessed: 17-Jan-2016], p. 2.
 “LM134/LM234/LM334 3-Terminal Adjustable Current Sources (Rev. E) - lm234.pdf,” LM134/LM234/LM334 3-Terminal Adjustable Current Source, 2013. [Online]. Available: http://www.ti.com/lit/ds/symlink/lm234.pdf. [Accessed: 05-Jan-2016], p. 8.
 Honeywell International Inc., “Platinum RTD Resistance vs. Temperature Function.” [Online]. Available: http://sensing.honeywell.com/index.php?ci_id=50025. [Accessed: 12-Nov-2015].
 P. R. Nelson, K. A. F. Copeland, and M. Coffin, Introductory Statistics for Engineering Experimentation. Elsevier Ltd, 2003, p. 36.
 U. A. Bakshi, A. V. Bakshi, and K. A. Bakshi, “Electrical Measurements and Measuring Instruments,”, 2007, p 1.28.
 “ITS-90.” [Online]. Available: http://www.its-90.com/its-90.html. [Accessed: 16-Jun-2014].
 Maxim Integrated Products Inc., “MAX6325/41/50 DS - MAX6325-MAX6350.pdf,” 2001. [Online]. Available: https://datasheets.maximintegrated.com/en/ds/MAX6325-MAX6350.pdf. [Accessed: 03-Feb-2016].