Acoustic emission testing of electrical stressed copper trace

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International Journal on Smart Sensing and Intelligent Systems

Professor Subhas Chandra Mukhopadhyay

Exeley Inc. (New York)

Subject: Computational Science & Engineering , Engineering, Electrical & Electronic

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eISSN: 1178-5608

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VOLUME 7 , ISSUE 5 (December 2014) > List of articles

Special issue ICST 2014

Acoustic emission testing of electrical stressed copper trace

Daniela Florian * / Thomas Wiesner / Bernhard G. Zagar

Keywords : acoustic emission testing, degradation copper wire and copper trace

Citation Information : International Journal on Smart Sensing and Intelligent Systems. Volume 7, Issue 5, Pages 1-6, DOI: https://doi.org/10.21307/ijssis-2019-068

License : (CC BY-NC-ND 4.0)

Published Online: 15-February-2020

ARTICLE

ABSTRACT

Copper becomes more and more important in the electronic industry. This metal is more resilient than conventional materials (like aluminium) due to the higher electrical and thermal conductivity. During several electrical stress pulses the copper changes. The surface can melt up and cracks and voids can develop inside the copper specimen.
In this paper we use acoustic emission testing to analyse copper degradation especially of copper and copper traces. It is evaluated if an acoustic wave excited by a thermo-electrical stress pulse can be detected by a simple measurement setup and if a correlation between the acoustic signal and the degradation exists. The idea is that during the degradation, the behaviour of the material changes which in turn influences the emitted acoustic signal.

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REFERENCES

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[6] A. V. Oppenheim, and  R. W. Schafer, Discrete-Time Signal Processing, Prentice Hall, 3 ed., 2009.

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